finda-training-course.co.uk logo
colour bars
spacer
finda-training-course.co.uk/search finda-training-course.co.uk/directory finda-training-course.co.uk/consultants finda-training-course.co.uk/software finda-training-course.co.uk/books finda-training-course.co.uk/events
spacer
spacer

   ACCELERATED TEST DATA ANALYSIS Training Course

Reference Number:597 Please send me an email with the details of the next course.

Benefits | For whom intended | Content | Applications | Lecturer | Registration |

Back to Top

APPLICATIONS OF ACCELERATED TESTING

Products last for years under normal operating conditions. However, product tests must quickly yield reliable information for management and engineering decisions. Accelerated testing quickly yields such information. Test specimens are subjected to higher than normal levels of temperature, voltage, humidity and vibration and fail much sooner. Then a mathematical model based on physical considerations is fitted to the early failure data, yielding estimates of product reliability under normal conditions, including the failure rate, percentage failing on warranty, and mean time to failure. This course will show how accelerated testing can be used to measure and improve the reliability of diverse products including:
  • Electronics which include microprocessors, semiconductors, solid-state devices, conductors, encapsulants, connections, and capacitors;
  • Metals undergoing fatigue, creep, rupture, and corrosion;
  • Electrical insulations and dielectrics in cables, motors, capacitors, and transformers;
  • Ceramics, plastics, composites, and other materials; and pharmaceuticals, food, paints and protective coatings, rubber and elastic materials, and chemicals.
Back to Top

Course Content

DAY 1:
  • 8:00-8:30 Registration and Continental Breakfast
  • 8:30-12:00, 1:00-3:00 Survey: applications, types of data, types of accelerated tests and stress loading, practical engineering considerations, and common tests (overstress, ESS, burn-in, single condition, elephant).
  • 3:00-5:00 Accelerated Testing Models: statistical life distributions (exponential, Weibull, lognormal, and others) and physical accelerated life-stress relationships (Arrhenius, inverse power, Eyring, etc,) including multivariable models for the effect of design, materials, manufacturing, operating, and other variables.
DAY 2:
  • 8:00-8:30 Continental Breakfast
  • 8:30-12:00 Models: (continued)
  • 1:00-5:00 Graphical Data Analysis: simple probability plots (Weibull, lognormal, etc.) and relationship plots (Arrhenius, inverse power, etc.) that yield estimates of product life and assessments of the data and assumed model (distribution and relationship).
DAY 3:
  • 8:00-8:30 Continental Breakfast
  • 8:30-12:00 Computer Data Analysis: maximum likelihood fitting of models to (censored) data with runouts to obtain estimates and confidence limits for product reliability and model parameters, and to assess the data and model.
  • 1:00-5:00 Test Plans: how to choose test conditions and the number of specimens at each, including optimum, traditional, and good compromise plans.
DAY 4:
  • 8:00-8:30 Continental Breakfast
  • 8:30-11:00 Competing Modes: series-system model for products with a number of failure modes, graphical and computer analysis of such data, and the effect of specimen and product size.
  • 11:00-12:00, 1:00-3:00 Step and Varying Stress: models and data analysis for tests with step and varying stress.
  • 3:00-5:00 Degradation: models and data analysis for accelerated tests where product performance degrades with age.
Back to Top

Who should attend

This Accelerated Test Data Analysis training course on engineering and statistical models and data analysis methods will benefit engineers, statisticians, and others working in development, reliability, testing, manufacturing, procurement, and data analysis.
You will learn how to use engineering and statistical models for accelerated tests, how to plan efficient tests, and how to estimate and improve product reliability.

Back to Top

Benefits of Attending

You will learn how to use up-to-date methods to successfully:
    • Determine test purposes.
    • Accelerate tests through overstress, high usage rate, termination of the test before all specimens fail, specimen design, degradation, cycling, etc.
    • Plan efficient tests that yield the most accurate product information for the allotted test time, cost, and constraints.
    • Model and understand how product life or degradation depends on accelerating stresses and on design, manufacturing, materials, and operating variables, thereby learning how to improve product reliability. Analyze test data with simple and informative plots to estimate reliability and to assess the data and assumed model.
    • Analyze data with different failure modes to estimate reliability at a design condition when all failure modes act or when some modes can be eliminated through better design or manufacture.
    • Compare designs, manufacturing methods, vendors, materials, etc., with respect to their effect on product reliability.
    • Analyze data with computer programs that provide reliability estimates with confidence limits indicating how accurate estimates are.

You will see a variety of applications to electronic, mechanical, and other products that will illustrate the methods. You will apply the methods to actual problems, including your own data, which you are encouraged to bring.

Back to Top

About the Lecturer

Wayne NelsonDr. Wayne Nelson - is a leading expert on reliability and accelerated test data analysis. Formerly with General Electric Research & Development for 23 years, he now consults on and teaches engineering applications of Statistics for many companies, professional societies, and universities.
For his contributions to reliability data analysis and accelerated testing, he was elected a Fellow of the I.E.E.E. (Institute of Electrical and Electronics Engineers), the American Society for Quality, and the American Statistical Association. He authored two other well-known Wiley books "ACCELERATED TESTING" and "APPLIED LIFE DATA ANALYSIS".
Among his 120+ publications, he received the Brumbaugh, Wilcoxon, and Youden Prizes of ASQ and eight outstanding presentation awards from ASA. For technical questions, he can be reached at 739 Huntingdon Dr., Schenectady, NY 12309, USA, Tel : +1 (518) 346-5138.

Back to Top

Further Information

  • For Further Information on this Training Course: such as Dates, Venue, Prices etc. please fill in your details on the form below and click the "submit" button.

.
Fields marked * * are mandatory

Course Title * *
Name * *
Email Address * *
Company Name
Address
Tel No.
Fax No.
Enquiry
    

Registration

  • On line
    Course registration can be completed, including secure payment via a credit card, by clicking on the email link immediately below.
Please send me an email with an On-Line registration LINK for this course.
  • Off line
    To register with any other form of payment simply click on the "CLICK HERE to pay without using a Credit Card " below left and follow the instructions.
CLICK HERE to pay without using a Credit Card
spacer
Back to Top

Introduction to EMC book

Newsletter | Home | EMC training | About Us | Medical Device courses | Contact Us | Sitemap | Press Releases | Useful Links | A-Z of Training Companies |

VISIT
the BOOK STORE

Telecoms
Environmental
Safety
Product Compliance and Integrity

BOOKS GALORE!


SCA logo
Compliance advice to the Electronics industry

1and1 banner


Advert

IT PAYS TO ADVERTISE

Contact
01555 890 515

spacer

spacer
. CLICK HERE TO SEE OTHER COURSES ON THIS TOPIC  
. CLICK HERE TO SEE OUR LIBRARY OF BOOKS ON THIS TOPIC  

colour blocks
spacer
hobbs