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DEMONSTRATING RELIABILITY WITH ACCELERATED TESTING Training Course |
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| This class uses extensive real life examples to teach the practical “How To” of the most efficient accelerated test methods available today. |
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Course Content
Accelerated test methods for mechanical and electrical devices will be explained and practiced in class following an explanation of the sciences that support their use.
Class time is organized by failure mechanism. The physics of each failure mechanism is explained, both at a science level and at a practical level. The major Stress-Life models that apply to each of the failure mechanisms will be explained through example in class. The majority of the class time will be spent learning exactly how to apply the accelerated test methods and their associated Stress-Life models to common test requirements. Class exercises along with video of product testing will reinforce all concepts taught. Methods for converting from “reliability on test” to “expected reliability in the field” will be explained by example. Explanation of the underlying concept of Stress-Strength-Interference will form the foundation for tying it all together.
The following will be covered in depth:
Statistical methods: decrease in sample size using the WeiBayes method (and various alternatives);
CALT: (extrapolation to normal stress from the outcome of increased stress tests; degradation analysis for wear (video example);
HALT: (receiving special attention, with videos of actual HALT tests; failure modes including fixturing, test profiles, and supplier involvement;
practical use of HAST: (an accelerated humidity test with video examples);
Arrhenius-Peck model (to calibrate HAST to normal use). |
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Is This What You Were Looking For?
We struggled for a period in our recent history where we could not accept the idea that qualitative tests and quantitative tests could co-exist to serve our needs simultaneously. We only have to look within to realize that our “left brain” and “right brain” have learned to work together to make our lives richer than would ever be possible using the traits of only one side of our brain. So what does this all have to do with accelerated testing? HALT (Highly Accelerated Life Test) activities continue to serve the qualitative testing needs of engineers everywhere, and ALT (Accelerated Life Test) techniques are growing to rapidly fulfill the quantitative needs of these same engineers. Accelerated life tests (ALT) are used to demonstrate reliability requirements, a fact of life in many industries. Fortunately, ALT has become more practical and efficient for the working engineer by evolving into a Calibrated Accelerated Life Test (CALT).
CALT takes the fundamental concepts of the ALT test made popular by Wayne Nelson, and provides a method for selecting stress levels to minimize test time and maximize confidence in the test results. This trait is a commendable addition to the evolution of the reliability discipline, especially for those of us who must always find an optimum balance between the “quality of what we know” and the “time available to know it.” CALT uses the method of testing to failure at different stress levels to define the life-stress relationship of the product in question. Generally this is performed using a single stress, but can be adopted to two stress models with increased complexity and test resource requirements. |
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About the Lecturer |
Larry Edson BSME, CQE
Larry is a Graduate of General Motors Institute (BSME), is a Certified Quality Engineer, and has 30 years of experience in the Quality/Reliability field. Larry introduced HALT to General Motors and to many of its suppliers. He has also co-taught with Gregg Hobbs on special occasions.
Larry has specialized in statistics, failure physics, and designed experimentation in pursuing a Master's Degree. Collectively, these topics and experiences form the foundation for much of his class.
Larry's work has been published through the Society of Mechanical Engineers and the Society of Automotive Engineers.
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Further Information
- Duration: - Two days
- Assessment: This course is a non-assessed short course.
- Dates + Venues: The next Public presentations are:
- 22-23 October, 2008 - New York, USA
- 19-20 November, 2008 - Denver CO USA
- Price : £680 + VAT (where applicable) per delegate. Fees include course materials, tuition, refreshments and lunches. The price does not include accommodation.
- Registration: On line course registration can be completed, including secure payment via a credit card, by using either the PayPal or Google Checkout "Buy Now" buttons below right.
To register with any other form of payment simply click on the "CLICK HERE without using a Credit Card " below left and follow the instructions.
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